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Purchase an entire system

Used Sick Optic Inspection Systems

JTS has used systems for sale. These systems and components are mainly from manufacturing plants that have closed, while others are from JTS inventory. A used system can be configured to fit your needs at a fraction of the cost of a new system.


Scanner and Optical Receiver Systems

The unique Sick Optic scanners employ a telecentric scanning technique which results in the scanning laser spot being perpendicular to the inspected surface. JTS has a variety of laser scanners and optical receiver systems that can be configured into a potential inspection system. 

Laser scanners come in various laser scanning widths to cover different product widths. Standard laser is the HeNe type (633nm) but other laser diode wavelengths can be employed. Currently available laser scanners are:

  • SC60: 60 mm scan width, focussed laser beam spot down to 50 um diameter
  • LC300: 300 mm scan width, focussed laser beam spot down to 120 um diameter
  • SC700: 700 mm scan width, focussed laser beam spot down to 120 um diameter
  • SC1250: 1250 mm scan width, focussed laser beam spot down to 150 um diameter
  • SC1600: 1600 mm scan width. focussed laser beam spot down to 150 um diameter


For the systems above, optical receivers available include both light collecting rod receivers (ERT series) and parabolic focused receivers (ERT-P series).


For more detailed information on the laser scanners and optical receivers, check out Improving Quality with Sick Optic Scan System.

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DFE-C Defect Processing Electronics and Computer

  • DFE-C electronics with 10 defect channels (optional 20 defect channels)
  • Up/downweb filtering for spot defects
  • Special scratch/streak defect detection
  • Running Defect Map on PC monitors and printer
  • SLIM interface software included, (extra HW optional)
  • Optional Ethernet interface available
  • The DFE-C electronics system can be interfaced to any laser scanner inspection system, and to many camera based inspection systems as well.  This would be a good option if your current inspection system electronics is no longer supported.  
  • JTS has an abundance of spare circuit boards and parts.  We also do repairs on circuit boards and parts
  • The HP1000 computer used in the DFE-C will always be supported by JTS and partners, but HP second hand resellers are also supporting it for at least ten more years because of heavy use in government applications and other industries.
  • The DFE-C electronics has been a very reliable system.  It just rarely fails.
  • Feel free to contact JTS for any details or questions
  • Please see the document DFE-C Description for more details


Check out our DFE-C system summary page for full details!

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SLIM Full Web Width and Defect Imaging System

SLIM is a full web width and defect imaging system. It can work in a standalone mode in a scroll mode displaying full web width or a zoomed portion of the width, and in a defect capture/zoom/save mode when tied to a host inspection system. The system is a VME based system using Eltec CPU and graphic controller that provides both a real time full width scrolling display as well as zoomed defect images.SLIM System - Full web width and defect imaging system.

  • Provides full web width color scrolling imaging of product
  • Provides capture and zoom (and storage if desired) of selected defect types
  • Displays on user selectable color monitor
  • Scroll SLIM can be interfaced to any inspection system with a video signal and line start synch signal
  • Defect capture and zoom is designed as an add-on to DFE-C systems, but can be interfaced to other inspection systems with necessary HW and programming on the inspection system end.  Contact JTS for details.
  • For more technical information, SLIM options, costs, etc. please feel free to contact JTS.For more information on the SLIM system, feel free to take a look at the documents listed below.
  • Image colors are user selectable
  • JTS provides complete sales, service, software and hardware upgrades for the Sick Large Image Memory (SLIM) imaging system
  • JTS has developed software and hardware upgrades to this system, vastly improving system performance and providing better long-term support
  • SLIM captures and zooms display of defect images in real time as they occur.  These images can be aitomatically stored to the hard drive for access later on.
  • SLIM displays line by line scrolling image of full web width, or a zoomed in portion of the width
  • JTS can also add network support for those users desiring plant-wide access to the defect pictures stored in SLIM
  • The SLIM system is flexible enough to adapt to other manufacturer web inspection systems including camera systems, or could be installed as a scroll only stand-alone system


For more information, review the PDF documentation on our SLIM System Summary page.

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